Sandpaper vs Atomic Force Microscope

The video lasts about one minute. This experiment uses an atomic force microscope (AFM) to observe the nanoscale morphology of 7000-grit sandpaper surfaces to verify the accuracy of the claimed grit size. The AFM, by scanning the sample surface with a probe, can obtain pixel-level resolution three-dimensional morphology images, which is a classic method for studying microstructures in materials science. The key point is to compare the differences between the nominal and measured data—the actual particle size of high-grit sandpaper often deviates from the claimed value, providing a direct reference for consumers' selection and industrial applications. The video is fast-paced, using everyday tools to test scientific instruments, combining entertainment and educational value. It is suitable for viewers interested in nanotechnology, material characterization, or DIY experiments. It is recommended to pay attention to the randomness of the particle distribution on the sandpaper surface while watching, and to think about the quality control issues of industrial mass-produced products. Thanks to icspi for providing support equipment.